Shaobin Ma, Xiaoyi Wang, S. Tan, Liang Chen, Jian He
{"title":"An Adaptive Electromigration Assessment Algorithm for Full-chip Power/Ground Networks","authors":"Shaobin Ma, Xiaoyi Wang, S. Tan, Liang Chen, Jian He","doi":"10.1109/ASP-DAC47756.2020.9045102","DOIUrl":null,"url":null,"abstract":"In this paper, an adaptive algorithm is proposed to perform electromigration (EM) assessment for full-chip power/ground networks. Based on the eigenfunction solutions, the proposed method improves the efficiency by properly selecting the eigenfunction terms and utilizing the closed-form eigenfunctions for commonly seen interconnect wires such as T-shaped or cross-shaped wires. It is demonstrated that the proposed method can trad-off well among the accuracy, efficiency and applicability of the eigenfunction based methods. The experimental results show that the proposed method is about three times faster than the finite difference method and other eigenfunction based methods.","PeriodicalId":125112,"journal":{"name":"2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"53 85 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASP-DAC47756.2020.9045102","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this paper, an adaptive algorithm is proposed to perform electromigration (EM) assessment for full-chip power/ground networks. Based on the eigenfunction solutions, the proposed method improves the efficiency by properly selecting the eigenfunction terms and utilizing the closed-form eigenfunctions for commonly seen interconnect wires such as T-shaped or cross-shaped wires. It is demonstrated that the proposed method can trad-off well among the accuracy, efficiency and applicability of the eigenfunction based methods. The experimental results show that the proposed method is about three times faster than the finite difference method and other eigenfunction based methods.