NASA Goddard Space Flight Center’s Recent Radiation Effects Test Results

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI:10.1109/REDW56037.2022.9921535

Alyson D. Topper, M. O’Bryan, E. Wilcox, Thomas A. Carstens, Jonathan D. Barth, M. Berg, M. Casey, Matthew B. Joplin, J. Lauenstein, M. Campola, Donna J. Cochran, J. Pellish, Peter J. Majewicz

引用次数: 0

Abstract

Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FPGAs, optoelectronics, digital, analog, and bipolar devices.

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美国宇航局戈达德太空飞行中心最近的辐射效应测试结果

进行了总电离剂量、位移损伤剂量和单事件效应测试，以表征和确定候选电子设备对NASA空间利用的适用性。测试的器件包括fpga、光电器件、数字器件、模拟器件和双极器件。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)

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