{"title":"Process multi-circuit optimization","authors":"A. Lokanathan, J. Brockman","doi":"10.1145/277044.277149","DOIUrl":null,"url":null,"abstract":"This paper describes the implementation of a concurrent methodology for integrated circuit optimization that spans the fabrication process design and circuit design disciplines. Results from this methodology show substantial performance gains as compared to a separate process/circuit optimization and a substantial time savings over an \"all-at-once\" combined optimization.","PeriodicalId":221221,"journal":{"name":"Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/277044.277149","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper describes the implementation of a concurrent methodology for integrated circuit optimization that spans the fabrication process design and circuit design disciplines. Results from this methodology show substantial performance gains as compared to a separate process/circuit optimization and a substantial time savings over an "all-at-once" combined optimization.