Possibilities and limitations of I/sub DDQ/ testing in submicron CMOS

Abstract

I/sub DDQ/ testing is a well accepted testing approach based on the observation of the quiescent current consumption. Its growing industrial implementation is based on the possibility of detecting defects which scope other more traditional testing methods. However, its application costs are higher and its effectiveness in deep submicron technologies may decrease if the current trend of leakage increase is not stopped by creative innovation.