Hybrid Test Access Mechanism for Multiple Identical Cores

Abstract

Recently, the demand for artificial intelligence such as IoT, autonomous vehicles and cloud is rapidly increased, and intelligent processors are expected to be used in all objects such as home appliances and automobiles. Intelligent processors are composed of multiple identical cores for parallel computation and acceleration of neural networks to implement artificial intelligence services. Due to the high degree of integration and the increase of test complexity in intelligent processors, efficient parallel testing is required. In this paper, a new test access mechanism is proposed to test the multiple identical cores. The proposed method solves the problem of the previous parallel test access mechanism in low-yield system without additional hardware and can test multiple identical cores at the cost of testing one core.