A Post-Silicon Debug Support Using High-Level Design Description

Yeonbok Lee, Tasuku Nishihara, Takeshi Matsumoto, M. Fujita
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引用次数: 3

Abstract

In this paper, we propose a post-silicon debug framework utilizing high-level design description, which provides great advantage of comprehensibility and readability in analyzing erroneous behaviors for debugging complicated post-silicon errors. The framework consists of the following methods; mapping between high-level and RTL, extracting error-relevant portions, and rank them by the degree of relevance with the error. We also exhibit several experimental results to show its effectiveness.
使用高级设计描述的后硅调试支持
本文提出了一种基于高级设计描述的后硅调试框架,该框架在分析错误行为方面具有很大的可理解性和可读性,可用于调试复杂的后硅错误。该框架包括以下方法;高级和RTL之间的映射,提取与错误相关的部分,并根据与错误的相关程度对它们进行排序。我们还展示了几个实验结果来证明它的有效性。
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