Photoluminescence Fourier-IR-transmission deep-level transient spectroscopy studies of diamond layers grown by hot-filament CVD

Abstract

The polycrystalline thin diamond films grown by HF CVD technique have been studied by FTIR, ESR, X-ray, Raman and photoluminescence spectroscopy. Pl spectra were recorded in temperatures range of 10-300K. The thermal behavior of the broad band luminescence indicates a D-A pair recombination process. The defects taking part in luminescence can be associated with hydrogen related centers. The presence of hydrogen in the diamond layers has been confirmed by FTIR and ESR measurements.