Moisture determination in hermetic IC packages by the dew point method using AC capacitance and conductance measurement

J. Sosniak, B. A. Unger
{"title":"Moisture determination in hermetic IC packages by the dew point method using AC capacitance and conductance measurement","authors":"J. Sosniak, B. A. Unger","doi":"10.1109/IEDM.1978.189363","DOIUrl":null,"url":null,"abstract":"The dew point in ceramic packages is shown to be observable by ac phase-sensitive measurement of the real and imaginary parts of the dielectric constant of an air gap capacitor. Only the package surface directly under the sensor is cooled, enhancing the sensitivity by preferential condensation. The dew point response peak is followed by a sharp drop due to interface freezing phenomena. Milligrams of liquid water had to be placed in the packages before sealing with epoxy at 175°C for dew points above -20°C to been seen. Large amounts of water were thus eliminated even at this moderate temperature.","PeriodicalId":164556,"journal":{"name":"1978 International Electron Devices Meeting","volume":"149 3","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1978 International Electron Devices Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEDM.1978.189363","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The dew point in ceramic packages is shown to be observable by ac phase-sensitive measurement of the real and imaginary parts of the dielectric constant of an air gap capacitor. Only the package surface directly under the sensor is cooled, enhancing the sensitivity by preferential condensation. The dew point response peak is followed by a sharp drop due to interface freezing phenomena. Milligrams of liquid water had to be placed in the packages before sealing with epoxy at 175°C for dew points above -20°C to been seen. Large amounts of water were thus eliminated even at this moderate temperature.
用交流电容和电导测量露点法测定密封IC封装中的水分
通过对气隙电容器介电常数实部和虚部的交流相敏测量,可以观察到陶瓷封装中的露点。只有传感器正下方的封装表面被冷却,通过优先冷凝来提高灵敏度。由于界面冻结现象,露点响应峰后出现急剧下降。在175°C用环氧树脂密封之前,必须在包装中放入数毫克的液态水,以观察露点高于-20°C的露点。因此,即使在这种温和的温度下,大量的水也被排除了。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信