T. Grassman, D. Chmielewski, S. Carnevale, J. Carlin, S. Ringel
{"title":"GaAsP/Si dual-junction solar cells grown by MBE and MOCVD","authors":"T. Grassman, D. Chmielewski, S. Carnevale, J. Carlin, S. Ringel","doi":"10.1109/PVSC.2015.7356384","DOIUrl":null,"url":null,"abstract":"Monolithic, direct epitaxial GaAs0.75P0.25/Si dual-junction (2J) solar cell structures have been grown via both molecular beam epitaxy (MBE) and metal-organic chemical vapor deposition (MOCVD). Fabricated test devices show working tandem behavior, with clear voltage addition and spectral partitioning, in both cases. Due to the thermal sensitivity of the MBE-grown tunnel junction structure, growth conditions necessary to maintain 2J activity yielded reduced quality GaAs0.75P0.25 top cell, while the more robust MOCVD-based tunnel junction enabled higher-quality top cell growth, resulting in overall higher performance 2J behavior. These initial prototype cells show promising performance and suggest several definite pathways for further device refinement.","PeriodicalId":427842,"journal":{"name":"2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)","volume":"40 3","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2015.7356384","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Monolithic, direct epitaxial GaAs0.75P0.25/Si dual-junction (2J) solar cell structures have been grown via both molecular beam epitaxy (MBE) and metal-organic chemical vapor deposition (MOCVD). Fabricated test devices show working tandem behavior, with clear voltage addition and spectral partitioning, in both cases. Due to the thermal sensitivity of the MBE-grown tunnel junction structure, growth conditions necessary to maintain 2J activity yielded reduced quality GaAs0.75P0.25 top cell, while the more robust MOCVD-based tunnel junction enabled higher-quality top cell growth, resulting in overall higher performance 2J behavior. These initial prototype cells show promising performance and suggest several definite pathways for further device refinement.