Exploiting program-level masking and error propagation for constrained reliability optimization

M. Shafique, Semeen Rehman, Pau Vilimelis Aceituno, J. Henkel
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引用次数: 63

Abstract

Since embedded systems design involves stringent design constraints, designing a system for reliability requires optimization under tolerable overhead constraints. This paper presents a novel reliability-driven compilation scheme for software program reliability optimization under tolerable overhead constraints. Our scheme exploits program-level error masking and propagation properties to perform reliability-driven prioritization of instructions and selective protection during compilation. To enable this, we develop statistical models for estimating error masking and propagation probabilities. Our scheme provides significant improvement in reliability efficiency (avg. 30%-60%) compared to state-of-the-art program-level protection schemes.
利用程序级屏蔽和错误传播进行约束可靠性优化
由于嵌入式系统设计涉及严格的设计约束,因此设计系统的可靠性需要在可容忍的开销约束下进行优化。针对可容忍开销约束下的软件程序可靠性优化问题,提出了一种新的可靠性驱动编译方案。我们的方案利用程序级错误屏蔽和传播特性来执行可靠性驱动的指令优先级和编译期间的选择性保护。为了实现这一点,我们开发了用于估计错误掩蔽和传播概率的统计模型。与最先进的程序级保护方案相比,我们的方案显著提高了可靠性效率(平均30%-60%)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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