2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573)

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2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) - 最新文献

Effectiveness of using supply voltage as back-gate bias in ground plane SOI MOSFET

Pub Date : 2004-12-01 DOI: 10.1109/SOI.2004.1391559 C.H. Kim, H. Ananthan, Jae-Joon Kim, K. Roy

Transfer of patterned Si and SiO/sub 2/ layers for the fabrication of patterned and mixed SOI

Pub Date : 2004-10-04 DOI: 10.1109/SOI.2004.1391617 H. Moriceau, C. Yalicheff, C. Gorla, A. Charvet, C. Morales, M. Zussy, J. Déchamp, N. Kernevez, F. Letertre, B. Ghyselen, C. Mazure, C. Lagahe-Blanchard, B. Aspar

DC and RF characterization of fully depleted strained SOI MOSFETs

Pub Date : 2004-10-04 DOI: 10.1109/SOI.2004.1391567 C. Chen, T. Langdo, C.K. Chen, J. Fiorenza, P. Wyatt, M. Currie, C. Leitz, G. Braithwaite, M. Fritze, R. Lambert, D. Yost, Z. Cheng, Anthony Lochtefeld, C. Keast

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