2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)

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2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) - 最新文献

Integrated Variability Measurements of 28 nm FDSOI MOSFETs down to 4.2 K for Cryogenic CMOS Applications

Pub Date : 2020-05-01 DOI: 10.1109/ICMTS48187.2020.9107906 B. C. Paz, L. L. Guevel, M. Cassé, G. Billiot, G. Pillonnet, A. Jansen, S. Haendler, A. Juge, E. Vincent, P. Galy, G. Ghibaudo, M. Vinet, S. D. Franceschi, T. Meunier, F. Gaillard

Multiscale modeling of CeO2/La2 O3 stacks for material/defect characterization

Pub Date : 2020-05-01 DOI: 10.1109/ICMTS48187.2020.9107922 B. Dianat, A. Padovani, L. Larcher

Test Structures for Noise Reduction of Fully Depleted-Silicon on Insulator p-Type Tunneling FET Using Channel Orientation

Pub Date : 2020-05-01 DOI: 10.1109/ICMTS48187.2020.9107915 Hyun-Dong Song, Hyeong-Sub Song, S. Eadi, Hyun-Woong Choi, Ga-Won Lee, H. Lee

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