2020 IEEE Physical Assurance and Inspection of Electronics (PAINE)

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2020 IEEE Physical Assurance and Inspection of Electronics (PAINE) - 最新文献

SPARTA-COTS: A Laser Probing Approach for Sequential Trojan Detection in COTS Integrated Circuits

Pub Date : 2020-12-15 DOI: 10.1109/PAINE49178.2020.9337728 Andrew Stern, Dhwani Mehta, Shahin Tajik, Ujjwal Guin, Farimah Farahmandi, M. Tehranipoor

Automated Detection and Localization of Counterfeit Chip Defects by Texture Analysis in Infrared (IR) Domain

Pub Date : 2020-12-15 DOI: 10.1109/PAINE49178.2020.9337739 P. Ghosh, Ulbert J. Botero, F. Ganji, D. Woodard, R. Chakraborty, Domenic Forte

Tracking Cloned Electronic Components using a Consortium-based Blockchain Infrastructure

Pub Date : 2020-12-15 DOI: 10.1109/PAINE49178.2020.9337735 Jason Vosatka, Andrew Stern, M.M. Hossain, Fahim Rahman, Jeffery Allen, M. Allen, Farimah Farahmandi, M. Tehranipoor

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