2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

查看最新文献

2016

2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - 最新文献

Advanced scan chain failure analysis using laser modulation mapping and continuous wave probing

Pub Date : 2012-07-02 DOI: 10.1109/IPFA.2012.6306326 S. Kasapi, W. Lo, J. Liao, B. Cory, H. Marks

Failure Analysis of damaged dielectric on resistor and capacitor with EMMI and IR-OBIRCH

Pub Date : 2012-07-02 DOI: 10.1109/IPFA.2012.6306276 Li Tian, Miao Wu, Diwei Fan, Chunlei Wu, Gaojie Wen, Dong Wang

Improving yield learning by rapid electrical fault inspection and localization

Pub Date : 2012-07-02 DOI: 10.1109/IPFA.2012.6306319 Beomjun Kim, Jongtaek Hong, Yongwoon Han, I. Kapilevich, J. Block, T. Lundquist, Myung Hwan Kim

查看全部

免责声明：
本页显示期刊或杂志信息，仅供参考学习，不是任何期刊杂志官网，不涉及出版事务，特此申明。如需出版一切事务需要用户自己向出版商联系核实。若本页展示内容有任何问题，请联系我们，邮箱：info@booksci.cn，我们会认真核实处理。