13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems

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13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - 最新文献

Memory elements based on minority-3 gates and inverters implemented in 90 nm CMOS

Pub Date : 2010-06-28 DOI: 10.1109/DDECS.2010.5491770 S. Aunet, Amir Hasanbegovic

A low phase noise 20 GHz voltage control oscillator using 0.18-μm CMOS technology

Pub Date : 2010-04-14 DOI: 10.1109/DDECS.2010.5491788 Chia-Ming Yang, H. Kao, Y. C. Chang, M. T. Chen, H. M. Chang, C. H. Wu

Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes

Pub Date : 2010-04-14 DOI: 10.1109/DDECS.2010.5491748 F. Wu, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Virazel, Junxia Ma, Wei Zhao, M. Tehranipoor, X. Wen

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