2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - 最新文献
Pub Date : 2012-03-18
DOI: 10.1109/STHERM.2012.6188822
J. Marcinichen, J. Thome
Pub Date : 2012-03-18
DOI: 10.1109/STHERM.2012.6188873
R. Mohammed, Yi Xia, R. Sahan, Y. Pang
Pub Date : 2012-03-18
DOI: 10.1109/STHERM.2012.6188874
L. Klein, S. Bermudez, Hans-Dieter Wehle, S. Barabasi, H. Hamann
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