2005 5th International Conference on Microwave Electronics: Measurement, Identification, Applications

2005 5th International Conference on Microwave Electronics: Measurement, Identification, Applications
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2005 5th International Conference on Microwave Electronics: Measurement, Identification, Applications - 最新文献

Influence of Photolithography Mistakes on Characteristics of Ftsp Transducer

Pub Date : 1900-01-01 DOI: 10.1109/MEMIA.2005.247504 A. Gridchin, V. Kolchuzhin, V. Gridchin, G. Suchanek, G. Gerlach

Session 3 Microwave Telecommunication Systems, Networks and Devices

Pub Date : 1900-01-01 DOI: 10.1109/memia.2005.247497

Information Security Services in the Millimeter-Wave Computer Network with Wireless Access

Pub Date : 1900-01-01 DOI: 10.1109/MEMIA.2005.247530 I. Minin, O. Minin
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