2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

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2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - 最新文献

Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test

Pub Date : 2019-04-24 DOI: 10.1109/DDECS.2019.8724644 F. Almeida, P. Bernardi, D. Calabrese, Marco Restifo, M. Reorda, D. Appello, G. Pollaccia, V. Tancorre, R. Ugioli, G. Zoppi

Fault-Aware Performance Assessment Approach for Embedded Networks

Pub Date : 2019-04-24 DOI: 10.1109/DDECS.2019.8724670 Jan Malburg, Karl Janson, J. Raik, F. Dannemann

New categories of Safe Faults in a processor-based Embedded System

Pub Date : 2019-04-24 DOI: 10.1109/DDECS.2019.8724642 C. C. Gürsoy, M. Jenihhin, Adeboye Stephen Oyeniran, D. Piumatti, J. Raik, M. Reorda, R. Ubar

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