Journal of Semiconductor Technology and Science

Journal of Semiconductor Technology and Science
期刊缩写:
J SEMICOND TECH SCI
影响因子:
0.5
ISSN:
print: 1598-1657
研究领域:
ENGINEERING, ELECTRICAL & ELECTRONIC-PHYSICS, APPLIED
h-index:
15
自引率:
0.00%
Gold OA文章占比:
0.00%
原创研究文献占比:
92.16%
SCI收录类型:
Science Citation Index Expanded (SCIE) || Scopus (CiteScore)
期刊介绍英文:
Journal of Semiconductor Technology and Science is published to provide a forum for R&D people involved in every aspect of the integrated circuit technology, i.e., VLSI fabrication process technology, VLSI device technology, VLSI circuit design and other novel applications of this mass production technology. When IC was invented, these people worked together in one place. However, as the field of IC expanded, our individual knowledge became narrower, creating different branches in the technical society, which has made it more difficult to communicate as a whole. The fisherman, however, always knows that he can capture more fish at the border where warm and cold-water meet. Thus, we decided to go backwards gathering people involved in all VLSI technology in one place.
CiteScore:
CiteScoreSJRSNIPCiteScore排名
0.90.1810.216
学科
排名
百分位
大类:Engineering
小类:Electrical and Electronic Engineering
654 / 797
18%
大类:Materials Science
小类:Electronic, Optical and Magnetic Materials
248 / 284
12%
发文信息
中科院SCI期刊分区
大类 小类 TOP期刊 综述期刊
4区 工程技术
4区 工程:电子与电气 ENGINEERING, ELECTRICAL & ELECTRONIC
4区 物理:应用 PHYSICS, APPLIED
WOS期刊分区
学科分类
Q4ENGINEERING, ELECTRICAL & ELECTRONIC
Q4PHYSICS, APPLIED
历年影响因子
2015年0.4670
2016年0.5150
2017年0.3740
2018年0.4070
2019年0.3640
2020年0.4740
2021年0.5610
2022年0.4000
2023年0.5000
历年发表
2012年55
2013年82
2014年103
2015年99
2016年107
2017年103
2018年95
2019年78
2020年70
2021年60
2022年40
投稿信息
出版语言:
English
出版国家(地区):
SOUTH KOREA
审稿时长:
6-12 weeks
出版商:
Institute of Electronics Engineers of Korea
编辑部地址:
RM #907 SCIENCE & TECHNOLOGY NEW BLDG, 635-4 YUCKSAM-DONG, SEOUL, SOUTH KOREA, KANGNAM-KU, 135-703

Journal of Semiconductor Technology and Science - 最新文献

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Security Problems of Latest FPGAs and Reverse Engineering Methods of Xilinx 7-series FPGAs

Pub Date : 2023-10-31 DOI: 10.5573/jsts.2023.23.5.283 Dongchan Lee, Sanghyun Lee, Mannhee Cho, Hyung-Min Lee, Youngmin Kim

Empirical Analysis of Disaggregated Cloud Memory on Memory Intensive Applications

Pub Date : 2023-10-31 DOI: 10.5573/jsts.2023.23.5.273 Yeonwoo Jeong, Gyeonghwan Jung, Kyuli Park, Youngjae Kim, Sungyong Park
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