International Symposium on the Physical and Failure Analysis of Integrated Circuits

Characterization and TCAD simulation of 90 nm technology transistors under continous photoelectric laser stimulation for failure analysis improvement

Pub Date : 2012-07-02 DOI: 10.1109/IPFA.2012.6306298 R. Llido, A. Sarafianos, O. Gagliano, V. Serradeil, V. Goubier, M. Lisart, G. Haller, V. Pouget, D. Lewis, J. Dutertre, A. Tria

Mechanical property characterization of cu-Sn-In intermetallic thin films using microcantilevers

Pub Date : 2011-07-04 DOI: 10.1109/IPFA.2011.5992788 W. A. Sasangka, C. L. Gan, C. V. Thompson