利用组合特征分析从低温电镜密度图中得到的原子结构。

Lin Chen, Jing He
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引用次数: 3

摘要

低温电子显微镜(cryo-EM)已成为测定蛋白质结构的主要技术。许多原子结构已经从大约3Å分辨率的低温电镜密度图中得到。侧链构象在超分辨率的密度图中可以很好地确定,例如1-2Å。希望有一种不需要超分辨率密度图的统计方法来检测异常侧链。在这项研究中,我们分别分析了分辨率高于1.5Å的x射线密度图和分辨率为2-4 Å和4-6 Å的低温电镜密度图的结构。我们引入了一种基于直方图的异常值评分(HBOS),用于从低温电镜密度图构建的蛋白质模型的异常检测。该方法使用x射线数据集(
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Using Combined Features to Analyze Atomic Structures Derived from Cryo-EM Density Maps.

Using Combined Features to Analyze Atomic Structures Derived from Cryo-EM Density Maps.

Using Combined Features to Analyze Atomic Structures Derived from Cryo-EM Density Maps.

Cryo-electron microscopy (cryo-EM) has become a major technique for protein structure determination. Many atomic structures have been derived from cryo-EM density maps of about 3Å resolution. Side-chain conformations are well determined in density maps with super-resolutions such as 1-2Å. It is desirable to have a statistical method to detect anomalous side-chains without a super-resolution density map. In this study, we analyzed structures derived from X-ray density maps with higher than 1.5Å resolution and those from cryo-EM density maps with 2-4 Å and 4-6 Å resolutions respectively. We introduce a histogram-based outlier score (HBOS) for anomaly detection in protein models built from cryo-EM density maps. This method uses the statistics derived from X-ray dataset (<1.5Å) as the reference and combines five features involving the distal block distance, side-chain length, phi, psi, and first chi angle of the residue. Higher percentages of anomalies were observed in the cryo-EM models than in the super-resolution X-ray models. Lower percentages of anomalies were observed in cryo-EM models derived after January 2017 than those derived before 2017.

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