{"title":"基于核磁共振的运动运动员高强度运动损伤识别","authors":"Scanning","doi":"10.1155/2023/9817542","DOIUrl":null,"url":null,"abstract":"<p><p>[This retracts the article DOI: 10.1155/2022/1016628.].</p>","PeriodicalId":21633,"journal":{"name":"Scanning","volume":"2023 ","pages":"9817542"},"PeriodicalIF":0.0000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10356341/pdf/","citationCount":"0","resultStr":"{\"title\":\"Retracted: Identification of Sports Athletes' High-Strength Sports Injuries Based on NMR.\",\"authors\":\"Scanning\",\"doi\":\"10.1155/2023/9817542\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>[This retracts the article DOI: 10.1155/2022/1016628.].</p>\",\"PeriodicalId\":21633,\"journal\":{\"name\":\"Scanning\",\"volume\":\"2023 \",\"pages\":\"9817542\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10356341/pdf/\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Scanning\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1155/2023/9817542\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"Physics and Astronomy\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Scanning","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1155/2023/9817542","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Physics and Astronomy","Score":null,"Total":0}
期刊介绍:
Scanning provides an international and interdisciplinary medium for the rapid exchange of information among all scientists interested in scanning electron, scanning probe, and scanning optical microscopies. Areas of specific interest include all aspects of the instrumentation associated with scanning microscopies, correlative microscopy techniques, stereometry, stereology, analytic techniques, and novel applications of the microscopies.