真空中薄平面液态水射流的成像温度和厚度。

IF 2.3 2区物理与天体物理 Q3 CHEMISTRY, PHYSICAL

Structural Dynamics-Us Pub Date : 2023-05-01 DOI:10.1063/4.0000188

Tillmann Buttersack, Henrik Haak, Hendrik Bluhm, Uwe Hergenhahn, Gerard Meijer, Bernd Winter

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引用次数: 1

摘要

我们提出了一个平面液态水微射流的温度在不同的环境压力，从真空到100%相对湿度的空间分辨测量。整个喷流表面由高分辨率红外摄像机一次性探测。所获得的二维图像基本上受红外摄像机对面设备的温度的影响;提出了一种校正热背景辐射的方法。在真空中，我们观察到由于水蒸发导致的冷却速率约为105 K/s。对于我们的系统，这相当于流动叶片的上游和下游位置之间的温度降低了大约15 K。通过对平面射流中热背景辐射的吸收进行合理的假设，我们可以扩展我们的分析来推断厚度图。对于参考系统，我们的厚度值与白光干涉测量报告的值很好地一致。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Imaging temperature and thickness of thin planar liquid water jets in vacuum.

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Imaging temperature and thickness of thin planar liquid water jets in vacuum.

We present spatially resolved measurements of the temperature of a flat liquid water microjet for varying ambient pressures, from vacuum to 100% relative humidity. The entire jet surface is probed in a single shot by a high-resolution infrared camera. Obtained 2D images are substantially influenced by the temperature of the apparatus on the opposite side of the infrared camera; a protocol to correct for the thermal background radiation is presented. In vacuum, we observe cooling rates due to water evaporation on the order of 10⁵ K/s. For our system, this corresponds to a temperature decrease in approximately 15 K between upstream and downstream positions of the flowing leaf. Making reasonable assumptions on the absorption of the thermal background radiation in the flatjet, we can extend our analysis to infer a thickness map. For a reference system, our value for the thickness is in good agreement with the one reported from white light interferometry.

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来源期刊

Structural Dynamics-Us CHEMISTRY, PHYSICALPHYSICS, ATOMIC, MOLECU-PHYSICS, ATOMIC, MOLECULAR & CHEMICAL

CiteScore

5.50

自引率

3.60%

发文量

审稿时长

16 weeks

期刊介绍： Structural Dynamics focuses on the recent developments in experimental and theoretical methods and techniques that allow a visualization of the electronic and geometric structural changes in real time of chemical, biological, and condensed-matter systems. The community of scientists and engineers working on structural dynamics in such diverse systems often use similar instrumentation and methods. The journal welcomes articles dealing with fundamental problems of electronic and structural dynamics that are tackled by new methods, such as: Time-resolved X-ray and electron diffraction and scattering, Coherent diffractive imaging, Time-resolved X-ray spectroscopies (absorption, emission, resonant inelastic scattering, etc.), Time-resolved electron energy loss spectroscopy (EELS) and electron microscopy, Time-resolved photoelectron spectroscopies (UPS, XPS, ARPES, etc.), Multidimensional spectroscopies in the infrared, the visible and the ultraviolet, Nonlinear spectroscopies in the VUV, the soft and the hard X-ray domains, Theory and computational methods and algorithms for the analysis and description of structuraldynamics and their associated experimental signals. These new methods are enabled by new instrumentation, such as: X-ray free electron lasers, which provide flux, coherence, and time resolution, New sources of ultrashort electron pulses, New sources of ultrashort vacuum ultraviolet (VUV) to hard X-ray pulses, such as high-harmonic generation (HHG) sources or plasma-based sources, New sources of ultrashort infrared and terahertz (THz) radiation, New detectors for X-rays and electrons, New sample handling and delivery schemes, New computational capabilities.