用于改进x射线总散射测量的倾斜探测器几何形状。

IF 6.1 3区 材料科学 Q1 Biochemistry, Genetics and Molecular Biology
Nicholas Burns, Aly Rahemtulla, Scott Annett, Beatriz Moreno, Stefan Kycia
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引用次数: 2

摘要

采用倾斜几何形状的数字平板面积探测器实现了x射线总散射测量,并与传统几何形状进行了比较。传统的几何结构在这里被定义为入射x射线束撞击并垂直于探测器最中心的像素。倾斜几何结构在这里由一个俯仰角为α的探测器定义,在这种情况下设置为15°,由垂直散射平面平分。所述探测器的定位使得入射x射线束沿底边缘撞击所述像素,90°散射x射线沿上边缘撞击所述像素。倾斜几何的几何属性转化为多重好处,例如可测量的散射范围扩展到90°,往复空间矢量Q的可达幅度增加47%,以及测量的总散射图的动态范围趋于均匀。因此,在更高的散射角度下,观察到信噪比提高了6倍,使采集时间减少了36倍。此外,减小了应用修正函数的范围,减小了终端波纹的大小,提高了对分布函数G(r)的实空间分辨率。综上所述,这些因素表明倾斜几何比传统几何产生更高质量的数据,可用于同时进行Rietveld细化和总散射研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An inclined detector geometry for improved X-ray total scattering measurements.

X-ray total scattering measurements are implemented using a digital flat-panel area detector in an inclined geometry and compared with the traditional geometry. The traditional geometry is defined here by the incident X-ray beam impinging on and normal to the center-most pixel of a detector. The inclined geometry is defined here by a detector at a pitch angle α, set to 15° in this case, bisected by the vertical scattering plane. The detector is positioned such that the incident X-ray beam strikes the pixels along the bottom edge and 90° scattered X-rays impinge on the pixels along the top edge. The geometric attributes of the inclined geometry translate into multiple benefits, such as an extension of the measurable scattering range to 90°, a 47% increase in the accessible magnitudes of the reciprocal-space vector Q and a leveling of the dynamic range in the measured total scattering pattern. As a result, a sixfold improvement in signal-to-noise ratios is observed at higher scattering angles, enabling up to a 36-fold reduction in acquisition time. Additionally, the extent of applied modification functions is reduced, decreasing the magnitude of termination ripples and improving the real-space resolution of the pair distribution function G(r). Taken all together, these factors indicate that the inclined geometry produces higher quality data than the traditional geometry, usable for simultaneous Rietveld refinement and total scattering studies.

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来源期刊
CiteScore
10.00
自引率
3.30%
发文量
178
审稿时长
4.7 months
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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