{"title":"低频噪声对电荷积累光电探测器阈值特性的影响","authors":"A.N. Sukhanov, V.V. Osipov, I.M. Mamedov","doi":"10.1016/0020-0891(92)90059-3","DOIUrl":null,"url":null,"abstract":"<div><p>The well-known Viner-Levi expression is generalized for the case of low-frequency <span><math><mtext>1</mtext><mtext>ƒ</mtext></math></span> noise and finite duration of physical measurement. On this basis, formulae for calculation of the statical charge fluctuation in photodetectors are found. It is shown that for an integration time <span><math><mtext>T</mtext><msub><mi></mi><mn>0</mn></msub><mtext>ƒ</mtext><msub><mi></mi><mn>0</mn></msub><msup><mi></mi><mn>−1</mn></msup></math></span>, where ƒ<sub>0</sub> is thefrequency below which the photodetectors noise spectrum has the form of <span><math><mtext>I</mtext><mtext>ƒ</mtext></math></span>, the detectivity of IR photoreceivers does not depend practically on the integration time <em>T</em><sub>0</sub>.</p></div>","PeriodicalId":81524,"journal":{"name":"Infrared physics","volume":"33 6","pages":"Pages 451-457"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0020-0891(92)90059-3","citationCount":"0","resultStr":"{\"title\":\"Influence of low-frequency 1ƒ noise on threshold characteristics of photodetectors with charge accumulation\",\"authors\":\"A.N. Sukhanov, V.V. Osipov, I.M. Mamedov\",\"doi\":\"10.1016/0020-0891(92)90059-3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>The well-known Viner-Levi expression is generalized for the case of low-frequency <span><math><mtext>1</mtext><mtext>ƒ</mtext></math></span> noise and finite duration of physical measurement. On this basis, formulae for calculation of the statical charge fluctuation in photodetectors are found. It is shown that for an integration time <span><math><mtext>T</mtext><msub><mi></mi><mn>0</mn></msub><mtext>ƒ</mtext><msub><mi></mi><mn>0</mn></msub><msup><mi></mi><mn>−1</mn></msup></math></span>, where ƒ<sub>0</sub> is thefrequency below which the photodetectors noise spectrum has the form of <span><math><mtext>I</mtext><mtext>ƒ</mtext></math></span>, the detectivity of IR photoreceivers does not depend practically on the integration time <em>T</em><sub>0</sub>.</p></div>\",\"PeriodicalId\":81524,\"journal\":{\"name\":\"Infrared physics\",\"volume\":\"33 6\",\"pages\":\"Pages 451-457\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0020-0891(92)90059-3\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Infrared physics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/0020089192900593\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Infrared physics","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0020089192900593","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Influence of low-frequency 1ƒ noise on threshold characteristics of photodetectors with charge accumulation
The well-known Viner-Levi expression is generalized for the case of low-frequency noise and finite duration of physical measurement. On this basis, formulae for calculation of the statical charge fluctuation in photodetectors are found. It is shown that for an integration time , where ƒ0 is thefrequency below which the photodetectors noise spectrum has the form of , the detectivity of IR photoreceivers does not depend practically on the integration time T0.
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