中子干涉测量新方法

D. Tuppinger, H. Rauch, J. Summhammer
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引用次数: 5

摘要

完美晶体干涉测量法正在成为精确测量相干散射长度的标准工具。到目前为止,准确度受限于波长和波长分布的确定所获得的分辨率。新测试的非色散样品排列避免了这一缺点,因为相移与波长无关。任意形状的样品可以通过一种改进的克里斯蒂安森滤波方法来测量,其中粉末样品的散射长度密度与周围液体的散射长度密度相匹配。用标准法测定了束缚相干散射长度bc(Bi) = 8.5165(62) fm,用非色散法测定了bc(Bi) = 8.521(4) fm,用Christiansen滤波法测定了bc(Si) = 4.157(3) fm。相位灵敏度达到2.2 × 10−5,可以很容易地提高到10−6的水平。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Novel measuring methods in neutron interferometry

Perfect crystal interferometry is becoming a standard tool for precise measurements of coherent scattering lengths. So far accuracy was limited by the resolution achieved with the determination of the wavelength and the wavelength distribution. The newly tested nondispersive sample arrangement avoids this shortcoming because the phase shift becomes independent of the wavelength. Arbitrarily shaped samples can be measured by an adapted Christiansen filter method, where the scattering length density of the powdered sample is matched to the scattering length density of a surrounding liquid. The following values for the bound coherent scattering lengths were determined: bc(Bi) = 8.5165(62) fm by the standard method, bc(Bi) = 8.521(4) fm by the nondispersive method and bc(Si) = 4.157(3) fm by the Christiansen filter method. A phase sensitivity of 2.2 × 10−5 was achieved, which could easily be increased to a level of 10−6.

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