在Xe中分离的C60基质:等离子体位移和极化效应

T.R. Ohno, G.H. Kroll, J.H. Weaver, L.P.F. Chibante, R.E. Smalley
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引用次数: 0

摘要

固体C60、基质分离C60和少量C60在Xe上的能量损失特征与稀有气体环境有关。相比之下,与现场π−π *振荡特征相关的损耗没有变化。由于周围介质的介电响应,分子等离子体激元的能量在隔离C60的基质中移动了~ 0.8 eV,从而降低了结合能。固体C60的功函数为5.0 eV。由于介质屏蔽,其电离电位为7.2 eV,相对于气相降低了0.4 eV。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
C60 matrix-isolated in Xe: plasmon shifts and polarization effects

Energy loss features for solid C60, matrix-isolated C60 in Xe, and for small amounts of C60 on Xe showed differences related to the rare gas environment. In contrast, losses related to on-site π−π shake-up features were unchanged. The energy of the molecular it plasmon shifts ∼ 0.8 eV to lower binding energy for matrix isolated C60 due to the dielectric response of the surrounding medium. The work function of solid C60 is 5.0 eV. Its ionization potential of 7.2 eV shows a reduction by 0.4 eV relative to the gas phase because of dielectric screening.

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