用V(x,t)数据进行粘接接头的无损检测

J. Sadler, S. Titov, R. Maev
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引用次数: 0

摘要

在本文中,我们研究了在典型的键合板的界面上检测键合和分离的无损检测问题。通过使用广角聚焦换能器,在空时域(V(x,t)数据)获得结果。该装置在板内产生多种兰姆模式,提供了在整个时间空间域中传播的漏波数据,消除了正入射测试方法中波形的时域重叠问题。直接比较V(x,t)数据,观察到额外的漏模反射,其中这些反射的周期随着胶粘剂层的厚度线性增加。此外,我们研究了由V(x,t)数据的二维傅里叶变换生成的k - f映射(V(k,f)数据),并简要比较了V(x,t)数据和k - f映射的预期理论结果与实验结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
12D-5 NDE of Adhesive Joints Using V(x,t) Data
In this paper we examine the NDE problem of the detection of bonding, verses disbonding, at the interfaces of a typical bonded plate. By using a wide angle focused transducers results are obtained in the space-time domain (V(x,t) data). This setup generates a variety of Lamb modes within the plate, provides leaky wave data spread throughout the time space domain, and eliminates the time domain overlap problems of waveforms from normal incidence testing method. Directly comparing the V(x,t) data additional leaky mode reflections are observed, where the period of these reflections if found to increase linearly with the thickness of the adhesive layer. Additionally we investigate the K-F map (V(k,f) data) generated from the 2D Fourier transform of the V(x,t) data, and briefly compare the expected theoretical results with the experimental results for both V(x,t) data, and K-F maps.
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