用半导体探测器测量伽马和x射线发射率时的自然线宽效应

K. Debertin, W. Pessara
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引用次数: 24

摘要

由于两种类型的辐射的自然线宽不同,x射线线的峰形与从半导体探测器获得的光谱中的伽马射线线的峰形不同。这排除了对伽玛和x射线峰应用相同的峰评估方法,并使用x射线源校准的探测器确定伽玛射线发射率变得复杂,反之亦然。计算了可能误差的数量级,并讨论了克服问题的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Natural line-width effects in gamma- and X-ray emission rate measurements with semiconductor detectors

The peak shapes of X-ray lines vary from those of gamma-ray lines in spectra obtained from semiconductor detectors due to different natural line widths for both types of radiation. This excludes the application of the same peak evaluation method for both gamma and X-ray peaks and complicates gamma-ray emission rate determinations with detectors calibrated by X-ray sources and vice versa. The order of magnitude of possible errors is calculated and ways to overcome the problem are discussed.

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