基于光谱和局部放电分析的GIS中自由移动粒子的风险评估

S. Meijer, Robert G. A. Zoetmulder, J. Smit, A. Girodet
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引用次数: 4

摘要

SF/sub - 6/气体绝缘开关设备中出现的移动粒子可能导致气体绝缘击穿。因此,及时跟踪这些缺陷并确定它们可能发生故障的风险是很重要的。对于这个风险分析过程,必须考虑以下四个步骤:缺陷的检测、定位、识别和风险评估。在这个贡献中,超高频方法被用来检测绝缘缺陷。飞行时间测量可以用来定位缺陷。缺陷识别是缺陷风险分析的重要环节。基于光谱分析或相位分辨PD模式分析可以应用不同的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Risk assessment of free moving particles in GIS using spectral and partial discharge analysis
Moving particles occurring in SF/sub 6/ gas-insulated switchgear can result in breakdown of the gaseous insulation. Therefore, it is important to trace such defects in time and to determine their risk for a possible breakdown. For this risk analysis process, the following four steps have to be taken into account: detection, location, identification and risk assessment of the defect. In this contribution, the UHF method has been used to detect insulation defects. Time-of-flight measurements can be used to locate the defect. The identification is an essential part for risk analysis of defects. Different methods can be applied based on spectral analysis or phase-resolved PD pattern analysis.
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