直接频率测量高达PHz频率

T. J. Pinkert, J. Morgenweg, I. Barmes, D. Kandula, C. Gohle, K. Eikema
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引用次数: 0

摘要

频率梳(FC)激光器精确测量光学频率的能力已经扩展到极紫外(XUV,波长短于100 nm),对应于多个PHz的频率。我们演示了51-85 nm波长范围内的“宽频梳生成”。我们的方法是基于近红外飞秒光纤激光器产生的一对脉冲的放大和相干上转换。在XUV中,用这些上转换的激光脉冲激发氩、氖和氦会产生拉姆齐样信号,对比度高达61%。利用这些信号,在51 nm处测定氦的基态电离能的精度达到6 MHz。基于一种新的泵浦激光器,期望进一步提高参数放大系统的khz级精度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Direct frequency metrology Up To PHz frequencies
The capability of frequency-comb (FC) lasers to precisely measure optical frequencies has been extended to the to the extreme ultraviolet (XUV, wavelengths shorter than 100 nm), corresponding to frequencies of multiple PHz. We demonstrate “broad frequency comb generation” for a wavelength range of 51–85 nm. Our method is based on amplification and coherent up-conversion of a pair of pulses originating from a near-infrared femtosecond FC laser. Excitation of argon, neon, and helium with these upconverted laser pulses in the XUV lead to Ramsey-like signals with up to 61% contrast. From these signals an accuracy of 6 MHz has been achieved in the determination of the ground state ionization energy of helium at 51 nm. Further improvement to a kHz-level accuracy is expected based on a new pump laser for the employed parametric amplification system.
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