第18届会议概述:自适应电路和数字调节器:数字电路技术小组委员会

D. Sylvester, K. Hirairi, E. Beigné
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引用次数: 0

摘要

本次会议的重点是检测和适应各种类型的过程电压-温度老化(PVTA)变化的电路,以及数字低差(LDO)稳压器的最新进展。所提出的自适应电路展示了快速和准确的电压下降检测,以执行指令节流,通过使用锁相环(PLL)和(降压)稳压器内的关键路径副本来延长时钟周期,以及用于温度,过程和老化补偿的闭环连续体偏置。有五篇数字LDO论文介绍了一系列新技术,例如模拟辅助NMOS功率晶体管,基于热频率的自适应采样方案,以及用开关电容电阻取代传统功率晶体管器件。这些论文还描述了一种分布式LDO阵列,它可以改善IR下降和响应时间,以及一种LDO,它可以最大限度地减少来自先前开关调节器的电压纹波的传递。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Session 18 overview: Adaptive circuits and digital regulators: Digital circuit techniques subcommittee
This session focuses on circuits that detect and adapt to various types of process-voltage-temperature-aging (PVTA) variations, along with the latest progress in digital low-dropout (LDO) voltage regulators. The presented adaptive circuits demonstrate rapid and accurate voltage-droop detection to perform instruction throttling, clock period stretching via use of a critical-path replica within the phase-locked loop (PLL) and (buck) voltage regulator, and closed-loop continuous-body-bias for temperature, process, and aging compensation. There are five digital LDO papers that introduce a range of new techniques, such as an analog-assisted NMOS power transistor, a beat-frequency-based adaptive-sampling scheme, and the replacement of traditional power-transistor devices with a switched-capacitor resistor. These papers also describe a distributed LDO array that improves IR drop and response time, as well as an LDO that is designed to minimize pass-through of voltage ripple from a preceding switching regulator.
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