基于非易失性内存逻辑架构的3.14 um2 4t - 2mtj单元全并行TCAM

S. Matsunaga, S. Miura, H. Honjo, K. Kinoshita, S. Ikeda, T. Endoh, H. Ohno, T. Hanyu
{"title":"基于非易失性内存逻辑架构的3.14 um2 4t - 2mtj单元全并行TCAM","authors":"S. Matsunaga, S. Miura, H. Honjo, K. Kinoshita, S. Ikeda, T. Endoh, H. Ohno, T. Hanyu","doi":"10.1109/VLSIC.2012.6243781","DOIUrl":null,"url":null,"abstract":"A four-MOS-transistor/two-MTJ-device (4T-2MTJ) cell circuit is proposed and fabricated for a standby-power-free and a high-density fully parallel nonvolatile TCAM. By optimally merging a nonvolatile storage function and a comparison logic function into a TCAM cell circuit with a nonvolatile logic-in-memory structure, the transistor counts required in the cell circuit become minimized. As a result, the cell size becomes 3.14um2 under a 90-nm CMOS and a 100-nm MTJ technologies, which achieves 60% and 86% of area reduction in comparison with that of a 12T-SRAM-based and a 16T-SRAM-based TCAM cell circuit, respectively.","PeriodicalId":6347,"journal":{"name":"2012 Symposium on VLSI Circuits (VLSIC)","volume":"60 1","pages":"44-45"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"83","resultStr":"{\"title\":\"A 3.14 um2 4T-2MTJ-cell fully parallel TCAM based on nonvolatile logic-in-memory architecture\",\"authors\":\"S. Matsunaga, S. Miura, H. Honjo, K. Kinoshita, S. Ikeda, T. Endoh, H. Ohno, T. Hanyu\",\"doi\":\"10.1109/VLSIC.2012.6243781\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A four-MOS-transistor/two-MTJ-device (4T-2MTJ) cell circuit is proposed and fabricated for a standby-power-free and a high-density fully parallel nonvolatile TCAM. By optimally merging a nonvolatile storage function and a comparison logic function into a TCAM cell circuit with a nonvolatile logic-in-memory structure, the transistor counts required in the cell circuit become minimized. As a result, the cell size becomes 3.14um2 under a 90-nm CMOS and a 100-nm MTJ technologies, which achieves 60% and 86% of area reduction in comparison with that of a 12T-SRAM-based and a 16T-SRAM-based TCAM cell circuit, respectively.\",\"PeriodicalId\":6347,\"journal\":{\"name\":\"2012 Symposium on VLSI Circuits (VLSIC)\",\"volume\":\"60 1\",\"pages\":\"44-45\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-06-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"83\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 Symposium on VLSI Circuits (VLSIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2012.6243781\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 Symposium on VLSI Circuits (VLSIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2012.6243781","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 83

摘要

提出并制作了一种4 mos晶体管/ 2 mtj器件(4T-2MTJ)单元电路,用于无备用电源和高密度全并联非易失性TCAM。通过将非易失性存储功能和比较逻辑功能以最佳方式合并到具有非易失性逻辑存储器结构的TCAM单元电路中,使单元电路所需的晶体管计数最小化。因此,在90 nm CMOS和100 nm MTJ技术下,单元尺寸为3.14um2,与基于12t - sram和基于16t - sram的TCAM单元电路相比,面积分别减少了60%和86%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 3.14 um2 4T-2MTJ-cell fully parallel TCAM based on nonvolatile logic-in-memory architecture
A four-MOS-transistor/two-MTJ-device (4T-2MTJ) cell circuit is proposed and fabricated for a standby-power-free and a high-density fully parallel nonvolatile TCAM. By optimally merging a nonvolatile storage function and a comparison logic function into a TCAM cell circuit with a nonvolatile logic-in-memory structure, the transistor counts required in the cell circuit become minimized. As a result, the cell size becomes 3.14um2 under a 90-nm CMOS and a 100-nm MTJ technologies, which achieves 60% and 86% of area reduction in comparison with that of a 12T-SRAM-based and a 16T-SRAM-based TCAM cell circuit, respectively.
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