S. Matsunaga, S. Miura, H. Honjo, K. Kinoshita, S. Ikeda, T. Endoh, H. Ohno, T. Hanyu
{"title":"基于非易失性内存逻辑架构的3.14 um2 4t - 2mtj单元全并行TCAM","authors":"S. Matsunaga, S. Miura, H. Honjo, K. Kinoshita, S. Ikeda, T. Endoh, H. Ohno, T. Hanyu","doi":"10.1109/VLSIC.2012.6243781","DOIUrl":null,"url":null,"abstract":"A four-MOS-transistor/two-MTJ-device (4T-2MTJ) cell circuit is proposed and fabricated for a standby-power-free and a high-density fully parallel nonvolatile TCAM. By optimally merging a nonvolatile storage function and a comparison logic function into a TCAM cell circuit with a nonvolatile logic-in-memory structure, the transistor counts required in the cell circuit become minimized. As a result, the cell size becomes 3.14um2 under a 90-nm CMOS and a 100-nm MTJ technologies, which achieves 60% and 86% of area reduction in comparison with that of a 12T-SRAM-based and a 16T-SRAM-based TCAM cell circuit, respectively.","PeriodicalId":6347,"journal":{"name":"2012 Symposium on VLSI Circuits (VLSIC)","volume":"60 1","pages":"44-45"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"83","resultStr":"{\"title\":\"A 3.14 um2 4T-2MTJ-cell fully parallel TCAM based on nonvolatile logic-in-memory architecture\",\"authors\":\"S. Matsunaga, S. Miura, H. Honjo, K. Kinoshita, S. Ikeda, T. Endoh, H. Ohno, T. Hanyu\",\"doi\":\"10.1109/VLSIC.2012.6243781\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A four-MOS-transistor/two-MTJ-device (4T-2MTJ) cell circuit is proposed and fabricated for a standby-power-free and a high-density fully parallel nonvolatile TCAM. By optimally merging a nonvolatile storage function and a comparison logic function into a TCAM cell circuit with a nonvolatile logic-in-memory structure, the transistor counts required in the cell circuit become minimized. As a result, the cell size becomes 3.14um2 under a 90-nm CMOS and a 100-nm MTJ technologies, which achieves 60% and 86% of area reduction in comparison with that of a 12T-SRAM-based and a 16T-SRAM-based TCAM cell circuit, respectively.\",\"PeriodicalId\":6347,\"journal\":{\"name\":\"2012 Symposium on VLSI Circuits (VLSIC)\",\"volume\":\"60 1\",\"pages\":\"44-45\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-06-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"83\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 Symposium on VLSI Circuits (VLSIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2012.6243781\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 Symposium on VLSI Circuits (VLSIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2012.6243781","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 3.14 um2 4T-2MTJ-cell fully parallel TCAM based on nonvolatile logic-in-memory architecture
A four-MOS-transistor/two-MTJ-device (4T-2MTJ) cell circuit is proposed and fabricated for a standby-power-free and a high-density fully parallel nonvolatile TCAM. By optimally merging a nonvolatile storage function and a comparison logic function into a TCAM cell circuit with a nonvolatile logic-in-memory structure, the transistor counts required in the cell circuit become minimized. As a result, the cell size becomes 3.14um2 under a 90-nm CMOS and a 100-nm MTJ technologies, which achieves 60% and 86% of area reduction in comparison with that of a 12T-SRAM-based and a 16T-SRAM-based TCAM cell circuit, respectively.