{"title":"一种基于k均值聚类算法的眼图参数测量方法","authors":"Bo Gao, Keyu Wei, L. Tong","doi":"10.1109/mwsym.2019.8700883","DOIUrl":null,"url":null,"abstract":"Eye diagram and its parameters measurement are very important to represent and analyze the high-speed digital signal. In this paper, K-means algorithm, which is popular in data mine, is introduced into the eye diagram parameters measurement. With the advantage of K-means algorithm, the method proposed in this paper can work automatically and effectively. A differential line is measured by vector network analyzer (VNA) and several eye diagrams at different data rates are generated by the measured S parameters. The method is used to measure these eye diagrams. Experiment results show that this method works very well.","PeriodicalId":6720,"journal":{"name":"2019 IEEE MTT-S International Microwave Symposium (IMS)","volume":"254 1","pages":"901-904"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"An eye diagram parameters measurement method based on K-means clustering algorithm\",\"authors\":\"Bo Gao, Keyu Wei, L. Tong\",\"doi\":\"10.1109/mwsym.2019.8700883\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Eye diagram and its parameters measurement are very important to represent and analyze the high-speed digital signal. In this paper, K-means algorithm, which is popular in data mine, is introduced into the eye diagram parameters measurement. With the advantage of K-means algorithm, the method proposed in this paper can work automatically and effectively. A differential line is measured by vector network analyzer (VNA) and several eye diagrams at different data rates are generated by the measured S parameters. The method is used to measure these eye diagrams. Experiment results show that this method works very well.\",\"PeriodicalId\":6720,\"journal\":{\"name\":\"2019 IEEE MTT-S International Microwave Symposium (IMS)\",\"volume\":\"254 1\",\"pages\":\"901-904\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE MTT-S International Microwave Symposium (IMS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/mwsym.2019.8700883\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE MTT-S International Microwave Symposium (IMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/mwsym.2019.8700883","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An eye diagram parameters measurement method based on K-means clustering algorithm
Eye diagram and its parameters measurement are very important to represent and analyze the high-speed digital signal. In this paper, K-means algorithm, which is popular in data mine, is introduced into the eye diagram parameters measurement. With the advantage of K-means algorithm, the method proposed in this paper can work automatically and effectively. A differential line is measured by vector network analyzer (VNA) and several eye diagrams at different data rates are generated by the measured S parameters. The method is used to measure these eye diagrams. Experiment results show that this method works very well.