Fariha Anjum, M. Samir Ullah, Jiban Podder, M. Shahjahan, Md. Mizanur Rahman
{"title":"锌掺杂二氧化钛薄膜的电学和光学性质","authors":"Fariha Anjum, M. Samir Ullah, Jiban Podder, M. Shahjahan, Md. Mizanur Rahman","doi":"10.1109/ICISET.2018.8745637","DOIUrl":null,"url":null,"abstract":"We have prepared pure Titanium dioxide (TiO2) and Zinc (Zn) doped TiO2 thin films by spray pyrolysis deposition (SPD) technique. The deposition temperature of the prepared thin films was maintained at $450^{\\mathrm{o}}\\mathrm{C}$ The structural property of the prepared thin films was characterized by X-ray diffraction (XRD) method. The results of XRD data showed that the structure of the as-deposited thin films was amorphous phase. The surface morphology and composition of the thin films were investigated by scanning electron microscope (SEM) and energy dispersive X-ray Spectroscopy (EDS), respectively. The electrical property, in particular, electrical resistivity was observed by four-point probe method as a function of temperature. It is depicted that the resistivity decreased with increasing temperature and exhibited semiconducting nature of the sample. The optical transmittance was measured by the UV-visible spectrometer. The transmittance for the pure TiO2 was found about 70% in the visible region.","PeriodicalId":6608,"journal":{"name":"2018 International Conference on Innovations in Science, Engineering and Technology (ICISET)","volume":"7 1","pages":"138-142"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Electrical and Optical Properties of Zinc doped Titanium dioxide Thin Films\",\"authors\":\"Fariha Anjum, M. Samir Ullah, Jiban Podder, M. Shahjahan, Md. Mizanur Rahman\",\"doi\":\"10.1109/ICISET.2018.8745637\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We have prepared pure Titanium dioxide (TiO2) and Zinc (Zn) doped TiO2 thin films by spray pyrolysis deposition (SPD) technique. The deposition temperature of the prepared thin films was maintained at $450^{\\\\mathrm{o}}\\\\mathrm{C}$ The structural property of the prepared thin films was characterized by X-ray diffraction (XRD) method. The results of XRD data showed that the structure of the as-deposited thin films was amorphous phase. The surface morphology and composition of the thin films were investigated by scanning electron microscope (SEM) and energy dispersive X-ray Spectroscopy (EDS), respectively. The electrical property, in particular, electrical resistivity was observed by four-point probe method as a function of temperature. It is depicted that the resistivity decreased with increasing temperature and exhibited semiconducting nature of the sample. The optical transmittance was measured by the UV-visible spectrometer. The transmittance for the pure TiO2 was found about 70% in the visible region.\",\"PeriodicalId\":6608,\"journal\":{\"name\":\"2018 International Conference on Innovations in Science, Engineering and Technology (ICISET)\",\"volume\":\"7 1\",\"pages\":\"138-142\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 International Conference on Innovations in Science, Engineering and Technology (ICISET)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICISET.2018.8745637\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Conference on Innovations in Science, Engineering and Technology (ICISET)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICISET.2018.8745637","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electrical and Optical Properties of Zinc doped Titanium dioxide Thin Films
We have prepared pure Titanium dioxide (TiO2) and Zinc (Zn) doped TiO2 thin films by spray pyrolysis deposition (SPD) technique. The deposition temperature of the prepared thin films was maintained at $450^{\mathrm{o}}\mathrm{C}$ The structural property of the prepared thin films was characterized by X-ray diffraction (XRD) method. The results of XRD data showed that the structure of the as-deposited thin films was amorphous phase. The surface morphology and composition of the thin films were investigated by scanning electron microscope (SEM) and energy dispersive X-ray Spectroscopy (EDS), respectively. The electrical property, in particular, electrical resistivity was observed by four-point probe method as a function of temperature. It is depicted that the resistivity decreased with increasing temperature and exhibited semiconducting nature of the sample. The optical transmittance was measured by the UV-visible spectrometer. The transmittance for the pure TiO2 was found about 70% in the visible region.