基于标记中心检测的子孔径拼接干涉法

张. Z. Min, 隋永新 Sui Yongxin, 杨怀江 Yang Huai-jiang
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引用次数: 0

摘要

相对运动较大的拼接干涉仪系统会导致子孔径定位精度明显降低。因此,实现了一种基于人工圆形标记中心检测的拼接方法,以寻找相邻两个子孔径之间所需的平移。首先,我们将标记中心的坐标作为标记的坐标来计算平移。然后通过齐次坐标变换将所有子孔径数据统一到同一参考点,并采用机械系统误差补偿算法拼接全孔径相位。对468 mm平面镜进行了子孔径拼接工艺,并在抛光过程中进行了表面精度测试。在此过程中,子孔径拼接测试为抛光提供了精确的表面数据,保证了表面误差快速收敛到最终均方根值为35 nm。实验结果表明,该方法放宽了子孔径定位的精度要求,能够准确地获得大口径光学元件的全孔径相位。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Subaperture stitching interferometry based on detection of marker center
The stitching interferometer systems with larger relative movement will show a significantly lower positioning accuracy of subapertures. As a consequence a stitching method based on detection of artificial circular mark center to find the necessary translation between two neighborly subapertures is implemented. Firstly,we take coordinates of mark centers as the marks' coordinates by which the translation is computed. Then all the subaperture data are unified into the same reference by homogeneous coordinate transformation and the full aperture phase are stitched by using mechanical system error compensation algorithm. A subaperture stitching process for a 468 mm flat mirror was carried out including surface accuracy tests during the polishing. In this process,subaperture stitching test offered the surface data precisely for polishing,which ensured the surfaceerror converged quickly to a final RMS of 35 nm. The experimental results show that the method relaxes the precision requirement for subaperture location and can get the full aperture phase for large optical element correctly.
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