光伏产业硅片切割技术的最新进展

IF 0.9 4区 材料科学 Q3 METALLURGY & METALLURGICAL ENGINEERING
Chang-yong Chen, Meng Sun, Xiao-qing Chen, Yi Wang, Zhouhua Jiang, Jianan Zhou
{"title":"光伏产业硅片切割技术的最新进展","authors":"Chang-yong Chen, Meng Sun, Xiao-qing Chen, Yi Wang, Zhouhua Jiang, Jianan Zhou","doi":"10.1051/metal/2021091","DOIUrl":null,"url":null,"abstract":"Using ultra-fine wire saw to cut solar grade silicon wafer is a very precise technology. In the past 20 years, researchers have done a lot of research and made great progress. The cutting method of silicon rod has developed from single line cutting to multi line simultaneous cutting, which greatly improves the production efficiency and the yield of silicon rod. However, the problems of high cutting loss, low cutting efficiency, and large surface damage of silicon wafer need to be solved; The surface of wire saw line has developed from smooth surface to coated diamond abrasive, which greatly improves the service life of wire saw line; The method of coated diamond abrasive on the surface of wire saw line has developed from resin consolidation to electroplating consolidation, which greatly improves the service life of wire saw line it improves the firmness of the coating; The arrangement of wire saw wire has developed from single wire to multi wire stranding, which makes the wire saw wire can cut large-size silicon rod; The minimum thickness of silicon wafer that can be cut is about 100–140 µm according to the perspective of stress analysis, while the excetive value should be located by more research.","PeriodicalId":18527,"journal":{"name":"Metallurgical Research & Technology","volume":"53 1","pages":""},"PeriodicalIF":0.9000,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Recent advances of silicon wafer cutting technology for photovoltaic industry\",\"authors\":\"Chang-yong Chen, Meng Sun, Xiao-qing Chen, Yi Wang, Zhouhua Jiang, Jianan Zhou\",\"doi\":\"10.1051/metal/2021091\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Using ultra-fine wire saw to cut solar grade silicon wafer is a very precise technology. In the past 20 years, researchers have done a lot of research and made great progress. The cutting method of silicon rod has developed from single line cutting to multi line simultaneous cutting, which greatly improves the production efficiency and the yield of silicon rod. However, the problems of high cutting loss, low cutting efficiency, and large surface damage of silicon wafer need to be solved; The surface of wire saw line has developed from smooth surface to coated diamond abrasive, which greatly improves the service life of wire saw line; The method of coated diamond abrasive on the surface of wire saw line has developed from resin consolidation to electroplating consolidation, which greatly improves the service life of wire saw line it improves the firmness of the coating; The arrangement of wire saw wire has developed from single wire to multi wire stranding, which makes the wire saw wire can cut large-size silicon rod; The minimum thickness of silicon wafer that can be cut is about 100–140 µm according to the perspective of stress analysis, while the excetive value should be located by more research.\",\"PeriodicalId\":18527,\"journal\":{\"name\":\"Metallurgical Research & Technology\",\"volume\":\"53 1\",\"pages\":\"\"},\"PeriodicalIF\":0.9000,\"publicationDate\":\"2021-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Metallurgical Research & Technology\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://doi.org/10.1051/metal/2021091\",\"RegionNum\":4,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"METALLURGY & METALLURGICAL ENGINEERING\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Metallurgical Research & Technology","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1051/metal/2021091","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"METALLURGY & METALLURGICAL ENGINEERING","Score":null,"Total":0}
引用次数: 1

摘要

使用超细线锯切割太阳能级硅片是一项非常精密的技术。在过去的20年里,研究人员做了大量的研究,取得了很大的进展。硅棒的切割方法从单线切割发展到多线同时切割,大大提高了硅棒的生产效率和成品率。但是,硅片切割损耗高、切割效率低、表面损伤大等问题需要解决;线锯线表面由光滑表面发展到涂覆金刚石磨料,大大提高了线锯线的使用寿命;金刚石磨料在线锯线表面涂覆的方法已从树脂固结发展到电镀固结,大大提高了线锯线的使用寿命,提高了涂层的牢固度;线锯线的排列方式由单线发展到多线绞合,使得线锯线可以切割大尺寸硅棒;从应力分析的角度来看,可切割硅片的最小厚度约为100-140µm,其执行值需进一步研究确定。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Recent advances of silicon wafer cutting technology for photovoltaic industry
Using ultra-fine wire saw to cut solar grade silicon wafer is a very precise technology. In the past 20 years, researchers have done a lot of research and made great progress. The cutting method of silicon rod has developed from single line cutting to multi line simultaneous cutting, which greatly improves the production efficiency and the yield of silicon rod. However, the problems of high cutting loss, low cutting efficiency, and large surface damage of silicon wafer need to be solved; The surface of wire saw line has developed from smooth surface to coated diamond abrasive, which greatly improves the service life of wire saw line; The method of coated diamond abrasive on the surface of wire saw line has developed from resin consolidation to electroplating consolidation, which greatly improves the service life of wire saw line it improves the firmness of the coating; The arrangement of wire saw wire has developed from single wire to multi wire stranding, which makes the wire saw wire can cut large-size silicon rod; The minimum thickness of silicon wafer that can be cut is about 100–140 µm according to the perspective of stress analysis, while the excetive value should be located by more research.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Metallurgical Research & Technology
Metallurgical Research & Technology METALLURGY & METALLURGICAL ENGINEERING-
CiteScore
1.70
自引率
9.10%
发文量
65
审稿时长
4.4 months
期刊介绍: Metallurgical Research and Technology (MRT) is a peer-reviewed bi-monthly journal publishing original high-quality research papers in areas ranging from process metallurgy to metal product properties and applications of ferrous and non-ferrous metals and alloys, including light-metals. It covers also the materials involved in the metal processing as ores, refractories and slags. The journal is listed in the citation index Web of Science and has an Impact Factor. It is highly concerned by the technological innovation as a support of the metallurgical industry at a time when it has to tackle severe challenges like energy, raw materials, sustainability, environment... Strengthening and enhancing the dialogue between science and industry is at the heart of the scope of MRT. This is why it welcomes manuscripts focusing on industrial practice, as well as basic metallurgical knowledge or review articles.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信