非晶氢化锗的结构、光学和电学研究

W.A. Turner , S.J. Jones, Y.M. Li , D. Pang, A.E. Wetsel, W. Paul
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引用次数: 2

摘要

采用射频辉光放电方法,在GeH4和H2气体等离子体中制备了高密度、无孔、高光导电性的非晶氢化锗(a- ge:H)薄膜。将这些薄膜沉积到安装在二极管反应器的通电电极上的衬底上,与未通电电极上的共沉积材料相比,表现出显著的改善。在衬底温度、放电功率和等离子体被H2稀释的系统变化下制备了薄膜。对于所使用的反应器几何形状,发现等离子体的稀释对于制备高质量的a-Ge:H至关重要。优化的a-Ge:H材料的制备条件与优化的a-Si:H的制备条件有很大的不同。我们认为这是发现与a-Si:H相比,a-SiGe:H合金性能差的主要原因。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Structural, optical, and electrical studies of amorphous hydrogenated germanium

High-density, non-porous, highly photoconductive films of amorphous hydrogenated germanium (a-Ge:H) showing minimal microstructure were prepared using the r.f. glow discharge method out of a gas plasma of GeH4 and H2. These films, deposited onto substrates mounted on the powered electrode of a diode reactor, showed remarkable improvement over codeposited material taken from the unpowered electrode. Films were also prepared under the systematic variation of substrate temperature, discharge power, and dilution of the plasma by H2. For the reactor geometry used, dilution of the plasma is found to be essential to the preparation of high-quality a-Ge:H. The conditions for the preparation of optimized a-Ge:H material were quite different from those found to produce optimized a-Si:H in this reactor. We assert this to be the principal cause of the finding of inferior properties for a-SiGe:H alloys when compared with a-Si:H.

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