湿法蚀刻制备CVD SiO2的有序形状

A. Baracu, R. Pascu, F. Craciunoiu
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引用次数: 0

摘要

正如我们所知,生长和沉积的SiO2都被认为是一种非晶材料。基于二氧化硅蚀刻的大量实验显示了一系列的微纳米结构,从而导致了多晶结构的假设。本文主要研究了SiO2在NH4F:CH3COOH溶液中湿法蚀刻后的“结晶”形式。为了改变混合物的选择性,我们测试了3种不同的浓度。利用扫描电镜、原子力显微镜和光学显微镜进行了大量的研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Ordered shapes of the CVD SiO2 evinced by wet etching
As we know, both grown and deposited SiO2 is considered an amorphous material. A lot of experiments based on the silicon dioxide etching showed a series of micro and nano-formations which lead to a polycrystalline structure assumption. This paper is focused on the “crystalline” form of the SiO2 after a wet etching in NH4F:CH3COOH solution. In order to modify the selectivity of the mixture, we have tested 3 different concentrations. There were performed a lot of investigations using SEM, AFM and Optical microscopy.
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