JWVST电子散斑干涉技术

B. Saif, Marcel Bluth, B. Eegholm, Barbara Zukowski, R. Keski-kuha, Peter Blake
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引用次数: 2

摘要

詹姆斯·韦伯太空望远镜(JWST)任务需要开发许多新技术来成功生产大型、轻量化、可展开、带分段主镜的低温望远镜。其中一项技术是干涉测量法,用于验证大型、可展开、轻质、低温、精密结构的结构变形,达到纳米级精度。为支持JWST光学望远镜元件(OTE)主反射镜的研制,设计并研制了瞬时采集相移散斑干涉仪。本文讨论了为JWST开发的电子散斑图样干涉仪(SPS-DSPI)的特性,以验证其在低温下测量大型复合材料结构变形的能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electronic Speckle Pattern Interferom-etry for JWVST
Development of many new technologies is required to successfully produce the large, lightweight, deployable, cryogenic telescope with segmented primary mirror for the James Webb Space Telescope (JWST) mission. One of the technologies is interferometry to verify structural deformations in large, deployable, lightweight, cryogenic, precision structures to nanometer level accuracy. An instantaneous acquisition phase shifting speckle interferometer was designed and built to support the development of JWST optical telescope element (OTE) primary mirror backplane. This paper discusses characterization of the electronic speckle pattern interferometer (SPS-DSPI) developed for JWST to verify its capability to measure structural deformations in large composite structures at cryogenic temperature.
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