LEnS:非易失性存储器处理器的寿命增强编码方案

Swatilekha Majumdar
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引用次数: 0

摘要

有限的写入持久性和高的每比特写入能耗限制了新兴的非易失性存储设备的使用。许多研究都集中在减少每次写操作的位翻转数量以减少瓶颈问题上。在本文中,我们提出了一种基于eNVM设备的存储器的寿命增强方案,该方案在比特流上分配比特翻转的数量,可以提高NVM处理器的续航时间和能量性能。与内容感知的位变换方案相比,该方案在写密集型应用中显著减少了至少40%的位翻转次数,并将处理器的性能提高了约55%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
LEnS: Lifetime Enhancement Coding Scheme for Non-volatile Memory Processors
Limited write endurance and high write energy consumption per bit restrict the use of emerging non-volatile memory devices. Many studies concentrate on reducing the number of bit-flips per write operation to reduce bottleneck issues. In this paper, we propose a lifetime enhancement scheme for eNVM device-based memories that distributes the number of bit-flips across the bitstream and can improve the endurance and energy performance of the NVM processors. The proposed scheme significantly reduces the number of bit-flips by ≥40% in write-intensive applications and improves the processor’s performance by ~ 55% as compared to content-aware bit-shuffling scheme.
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