{"title":"LEnS:非易失性存储器处理器的寿命增强编码方案","authors":"Swatilekha Majumdar","doi":"10.1109/MWSCAS47672.2021.9531891","DOIUrl":null,"url":null,"abstract":"Limited write endurance and high write energy consumption per bit restrict the use of emerging non-volatile memory devices. Many studies concentrate on reducing the number of bit-flips per write operation to reduce bottleneck issues. In this paper, we propose a lifetime enhancement scheme for eNVM device-based memories that distributes the number of bit-flips across the bitstream and can improve the endurance and energy performance of the NVM processors. The proposed scheme significantly reduces the number of bit-flips by ≥40% in write-intensive applications and improves the processor’s performance by ~ 55% as compared to content-aware bit-shuffling scheme.","PeriodicalId":6792,"journal":{"name":"2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"5 1","pages":"365-368"},"PeriodicalIF":0.0000,"publicationDate":"2021-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"LEnS: Lifetime Enhancement Coding Scheme for Non-volatile Memory Processors\",\"authors\":\"Swatilekha Majumdar\",\"doi\":\"10.1109/MWSCAS47672.2021.9531891\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Limited write endurance and high write energy consumption per bit restrict the use of emerging non-volatile memory devices. Many studies concentrate on reducing the number of bit-flips per write operation to reduce bottleneck issues. In this paper, we propose a lifetime enhancement scheme for eNVM device-based memories that distributes the number of bit-flips across the bitstream and can improve the endurance and energy performance of the NVM processors. The proposed scheme significantly reduces the number of bit-flips by ≥40% in write-intensive applications and improves the processor’s performance by ~ 55% as compared to content-aware bit-shuffling scheme.\",\"PeriodicalId\":6792,\"journal\":{\"name\":\"2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)\",\"volume\":\"5 1\",\"pages\":\"365-368\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-08-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSCAS47672.2021.9531891\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS47672.2021.9531891","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
LEnS: Lifetime Enhancement Coding Scheme for Non-volatile Memory Processors
Limited write endurance and high write energy consumption per bit restrict the use of emerging non-volatile memory devices. Many studies concentrate on reducing the number of bit-flips per write operation to reduce bottleneck issues. In this paper, we propose a lifetime enhancement scheme for eNVM device-based memories that distributes the number of bit-flips across the bitstream and can improve the endurance and energy performance of the NVM processors. The proposed scheme significantly reduces the number of bit-flips by ≥40% in write-intensive applications and improves the processor’s performance by ~ 55% as compared to content-aware bit-shuffling scheme.