{"title":"w波段扩展相互作用输出腔的稳定性分析","authors":"Yong Zhong, Yong Wang","doi":"10.1109/IVEC.2014.6857630","DOIUrl":null,"url":null,"abstract":"In this paper, a novel w-band extended interaction output cavity stability analysis is presented. Adopting beam quality factor and PIC code, stability analysis of the eight ladder grids cavity is discussed for the 2π operation mode. Results show that reasonable beam quality factor can reach more stable output power without oscillation of parasitic mode.","PeriodicalId":88890,"journal":{"name":"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference","volume":"4 1","pages":"343-344"},"PeriodicalIF":0.0000,"publicationDate":"2014-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Stability analysis of W-band extended interaction output cavity\",\"authors\":\"Yong Zhong, Yong Wang\",\"doi\":\"10.1109/IVEC.2014.6857630\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a novel w-band extended interaction output cavity stability analysis is presented. Adopting beam quality factor and PIC code, stability analysis of the eight ladder grids cavity is discussed for the 2π operation mode. Results show that reasonable beam quality factor can reach more stable output power without oscillation of parasitic mode.\",\"PeriodicalId\":88890,\"journal\":{\"name\":\"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference\",\"volume\":\"4 1\",\"pages\":\"343-344\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-04-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVEC.2014.6857630\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC.2014.6857630","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Stability analysis of W-band extended interaction output cavity
In this paper, a novel w-band extended interaction output cavity stability analysis is presented. Adopting beam quality factor and PIC code, stability analysis of the eight ladder grids cavity is discussed for the 2π operation mode. Results show that reasonable beam quality factor can reach more stable output power without oscillation of parasitic mode.