喷雾热解法制备SnO_2:F/CdS/CdTe薄膜及其物理光学性能研究

A. Musa, A. B. Ahmed, Mansur Said, Mani Tsoho, A. Suleiman
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引用次数: 0

摘要

采用喷雾热解(SP)技术在钠石灰玻璃衬底上分别制备了氟掺杂氧化锡薄膜、硫化镉薄膜和碲化镉薄膜,是光学传感器、发光二极管、晶体管和光伏电池等光电器件中重要的半导体材料。通过x射线衍射、扫描电镜和光学研究等技术对薄膜进行了表征。x射线衍射测量结果表明,所制备的薄膜为锡石型,具有四方金红石结构;x射线衍射图上不同平面峰的观察表明,所制备的薄膜为立方结构。薄膜的主峰在,这是化合物的特征峰,在主峰处得到薄膜结构,表明薄膜沿方向的首选取向。这证实了薄膜的形成,(111)为最强的优选取向面。用扫描电子显微镜(SEM)分析了薄膜的表面形貌。结果表明,制备的FTO、CdS和CdTe薄膜可用于太阳能领域。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Thin Films Growth of SnO_2:F/CdS/CdTe, and Studies of Their Physical and Optical Properties using Spray Pyrolysis Techniques
Fluorine doped tin oxide, Cadmium Sulphide  and Cadmium Telluride  thin films have been deposted on Soda Lime glass substrate at  respectively by spray pyrolysis (SP) technique and are important semiconductor materials in optoelectronic devices such as optical sensors, light-emitting diodes, transistors and photovoltaic cells.  thin films were characterized by various techniques such as X-ray diffraction, SEM and optical studies. X-ray diffraction measurements show that the deposited   was found to be of cassiterite type with tetragonal rutile structure, observation of peaks of different planes on an X-ray diffraction graph of  thin film showed that  film obtained were cubic structure. The main peak value of  thin film is seen at , which is the characteristic peak of the  compound  and the  film structure was obtained at the major peak  indicating the preferred orientation of  films along  direction. This confirms the formation of  thin film, with (111) as the strongest preferred plane of orientation. The surface morphology of the thin films was analysed by scanning electron microscopy (SEM). The optical energy band gap of thin films are determine  The results showed that the prepared FTO, CdS and CdTe films can be used in solar energy applications.
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