H. Uehara, T. Okamoto, Y. Sekii, S. Iwata, T. Takada
{"title":"用Q(t)法和量子化学计算分析XLPE和含酚类抗氧化剂PE的电荷阱深度","authors":"H. Uehara, T. Okamoto, Y. Sekii, S. Iwata, T. Takada","doi":"10.1109/CEIDP50766.2021.9705439","DOIUrl":null,"url":null,"abstract":"Measurements using the direct current integrated charge method (Q(t) method) revealed that the low-density polyethylene with phenolic antioxidants (LDPE+AO) sample had higher electric field characteristics and heat resistances than the cross-linked polyethylene (XLPE) sample. In this study, we analyzed the high electric field characteristics and heat resistance of the LDPE+AO sample from the standpoint of charge trap depth using molecular dynamics (MD) simulation and quantum chemical calculation. The results showed that AO addition was involved in the formation of deep charge traps.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"60 1","pages":"454-457"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Analysis of Charge Trap Depth Using Q(t) Method and Quantum Chemical Calculation in XLPE and PE with Phenolic Antioxidant\",\"authors\":\"H. Uehara, T. Okamoto, Y. Sekii, S. Iwata, T. Takada\",\"doi\":\"10.1109/CEIDP50766.2021.9705439\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Measurements using the direct current integrated charge method (Q(t) method) revealed that the low-density polyethylene with phenolic antioxidants (LDPE+AO) sample had higher electric field characteristics and heat resistances than the cross-linked polyethylene (XLPE) sample. In this study, we analyzed the high electric field characteristics and heat resistance of the LDPE+AO sample from the standpoint of charge trap depth using molecular dynamics (MD) simulation and quantum chemical calculation. The results showed that AO addition was involved in the formation of deep charge traps.\",\"PeriodicalId\":6837,\"journal\":{\"name\":\"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)\",\"volume\":\"60 1\",\"pages\":\"454-457\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-12-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP50766.2021.9705439\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP50766.2021.9705439","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analysis of Charge Trap Depth Using Q(t) Method and Quantum Chemical Calculation in XLPE and PE with Phenolic Antioxidant
Measurements using the direct current integrated charge method (Q(t) method) revealed that the low-density polyethylene with phenolic antioxidants (LDPE+AO) sample had higher electric field characteristics and heat resistances than the cross-linked polyethylene (XLPE) sample. In this study, we analyzed the high electric field characteristics and heat resistance of the LDPE+AO sample from the standpoint of charge trap depth using molecular dynamics (MD) simulation and quantum chemical calculation. The results showed that AO addition was involved in the formation of deep charge traps.