提取多输入FGMOS晶体管上的浮栅电压

C. Davila-Saldivar, A. Medina-Vázquez, Abimael Jiménez-Pérez, M. A. Gurrola-Navarro
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引用次数: 1

摘要

讨论了多输入浮栅晶体管浮栅电压的提取方法,以便更好地理解其特性。讨论了极低电压下线性度的不足。实验表明,尽管使用金属触点放电,浮栅上仍存在残余电荷。这种分析有助于增强数学模型,从而在仿真过程中获得更好的结果,特别是当该器件被用作完全模拟处理元件时。讨论了浮栅电压的提取和绘制方法。给出了分析结果与实验结果的比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Extracting the floating gate voltage on the multiple-input FGMOS transistor
The extraction of the floating gate voltage on the Multiple-Input Floating-Gate Transistor is discussed in order to understand their behavior in a better way. The lack of linearity at very low voltage is discussed. The presence of a residual charge on the floating gate is experimentally shown despite the use of metal contact to discharge it. This analysis is useful to enhance the mathematical model and consequently to have better results in the simulation process especially when this device is used as an entirely analog processing element. Methods to extract and plot the floating gate voltage are addressed. A comparison between analytical and experimental results is shown.
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