异丙醇(IPA)对KOH溶液中硅刻蚀速率和表面粗糙度的影响

N. Burham, A. A. Hamzah, B. Majlis
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引用次数: 9

摘要

本文研究了在氢氧化钾(KOH)溶液中对氮化硅进行方框刻蚀的工艺。分析了刻蚀速率与温度变化的相互关系。可以在KOH溶液中加入特殊的添加剂,如异丙醇,以提高表面的光滑度。这种光滑的表面是硅膜上产生孔所必需的。结果表明,添加10%的异丙酸可以改善表面粗糙度,提高蚀刻速率。这是通过在AFM和光学显微镜下检查基板来验证的。用IPA还减少了蚀刻过程后产生的微管。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect of isopropyl alcohol (IPA) on etching rate and surface roughness of silicon etched in KOH solution
This paper studies the etching process of <;100> silicon wafers in Potassium Hydroxide (KOH) solution by patterning the silicon nitride with a square frame. The mutual relationship of the etching rate and temperature variation has been analysed. Particular additives like isopropyl alcohol can be added to the KOH solution to improve the smoothness of the surface plane. This smooth surface is necessary to produce pores on the silicon membrane. The addition of 10% IPA is proven to improve the surface roughness and increase the etching rate. This is verified by inspecting the substrate under AFM and optical microscopy. The micro pipes produced after an etching process were also reduced using the IPA.
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