Qiugui Zhou, Han-din Liu, D. Mcintosh, Chong Hu, J. Campbell
{"title":"盖革模式碳化硅雪崩光电二极管的仿真","authors":"Qiugui Zhou, Han-din Liu, D. Mcintosh, Chong Hu, J. Campbell","doi":"10.1109/NUSOD.2010.5595642","DOIUrl":null,"url":null,"abstract":"The breakdown probability and timing jitter of silicon carbide single-photon avalanche diodes were simulated with a random path length Monte-Carlo model. The results are in good agreement with the measured device characteristics.","PeriodicalId":6780,"journal":{"name":"2021 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)","volume":"49 1","pages":"111-112"},"PeriodicalIF":0.0000,"publicationDate":"2010-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Simulation of Geiger mode silicon carbide avalanche photodiode\",\"authors\":\"Qiugui Zhou, Han-din Liu, D. Mcintosh, Chong Hu, J. Campbell\",\"doi\":\"10.1109/NUSOD.2010.5595642\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The breakdown probability and timing jitter of silicon carbide single-photon avalanche diodes were simulated with a random path length Monte-Carlo model. The results are in good agreement with the measured device characteristics.\",\"PeriodicalId\":6780,\"journal\":{\"name\":\"2021 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)\",\"volume\":\"49 1\",\"pages\":\"111-112\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-10-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NUSOD.2010.5595642\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NUSOD.2010.5595642","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Simulation of Geiger mode silicon carbide avalanche photodiode
The breakdown probability and timing jitter of silicon carbide single-photon avalanche diodes were simulated with a random path length Monte-Carlo model. The results are in good agreement with the measured device characteristics.