温度对ERIP套管电容器铁芯频域介电光谱影响的研究

Tai-Hung Liu, Xiongjie Xie, Xiaoqing Luo, Wei Hu, Zuoming Xu, P. Yin, Qiming Ye
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引用次数: 0

摘要

环氧树脂浸渍纸(ERIP)衬套电容器芯是电容级配衬套的主要绝缘部件之一。在实际工作环境中,ERIP套管电容器铁芯的绝缘性能受温度的影响。为了探讨温度对ERIP套管电容器铁心频率介电响应的影响,利用频域介电光谱(FDS)对ERIP套管电容器铁心在不同温度下的频率介电响应进行了分析,建立了双弛豫Debye模型。首先,对ERIP套管电容器铁心进行了温度实验,分别在20℃、40℃、60℃、80℃和100℃对套管铁心进行了FDS测试。其次,绘制了介质损耗因子(tanδ)和复电容实部和虚部在不同温度下的FDS谱;最后,基于双松弛Debye模型,分析了温度对ERIP套芯电容器FDS试验的影响。测试结果和分析表明,tanδ的整个频谱,复电容的虚部都向垂直正方向移动,并向高频移动。双松弛Debye模型获得了较好的拟合结果,对数据的拟合程度超过90%。高频介电常数、界面极化损耗和偶极极化损耗可以弥补复电容的实部。这些结论可以为ERIP套管式电容器铁心提供一个数学模型,为套管式电容器铁心绝缘的老化状态提供支持。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Research on the Influences of Temperature on Frequency Domain Dielectric Spectroscopy of the ERIP Bushing Capacitor Core
Epoxy resin impregnated paper (ERIP) bushing capacitor core is one of the main insulation part of the capacitance graded bushing. The insulating property of the ERIP bushing capacitor core is influenced by the temperature in the actual operation environmental. In order to explore the influence of temperature on frequency dielectric response of the ERIP bushing capacitor core, the frequency domain dielectric spectroscopy (FDS) is utilized for ERIP bushing capacitor core at different temperature, then a double relaxation Debye model is proposed in the paper. Firstly, the temperature experiment of ERIP bushing capacitor core is carried out, and the FDS test is performed on the bushing core at 20°C, 40°C, 60°C, 80°C and 100°C, respectively. Secondly, the FDS spectrum of the dielectric loss factor (tanδ) and the real and imaginary parts of the complex capacitance are plotted at different temperature. Finally, the influences of temperature on FDS test of ERIP bushing capacitor core are analyzed based on a double relaxation Debye model. The test results and analysis indicated that the entire spectrum of tanδ, the imaginary part of the complex capacitance are shown to shift toward the positive vertical direction and move to the high frequency. A good fitness result is obtained by the double relaxation Debye model, and the degree of fit on the data exceeds 90%. The high-frequency dielectric constant, interfacial polarization loss and dipole polarization loss can be made up for the real part of the complex capacitance. These conclusions can provide a mathematical model for the ERIP bushing capacitor core, which will be supportive for ageing state of bushing core insulation.
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