掺钙钛酸钡陶瓷电容器的降解行为

M. Huh, K. Cho, H. Nam, H. Lee
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引用次数: 0

摘要

采用高加速寿命试验装置研究了镍内电极含钙mlcc的电降解。在商业mlcc中发现了外在和内在的故障。从电压指数因子和伪活化能等退化参数的估计值可以看出,材料的内在破坏是由热失控引起的。虽然镍电极mlcc的降解模式与普通钯电极mlcc相似,但前者的最大额定寿命在5 ~ 30年之间,总体上短于后者。这种差异归因于氧空位浓度的差异。因此,可能的降解机制应该与氧空位运动有关。其中包括还原模型、晶界障碍模型和脱混模型。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Degradation behavior of Ca-doped barium titanate ceramic capacitors
Electrical degradation of calcium-containing MLCCs having nickel internal electrode was studied using a highly accelerated life test set-up. Both extrinsic and intrinsic failures were identified in commercial MLCCs. From the estimated values of degradation parameters such as voltage exponent factor and pseudo-activation energy, it was found that the intrinsic failure took place by thermal runaway. Although, the degradation pattern for nickel electrode MLCCs was similar to that for common palladium electrode MLCCs, the maximum rated lifetime of the former was in the range of 5 to 30 years and was, in general, shorter than that of the latter. This difference was ascribed to the difference in oxygen vacancy concentrations. Thus, possible degradation mechanisms should be related to oxygen vacancy movement. Among them are reduction model, grain boundary barrier model and de-mixing model.
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