{"title":"器件几何形状和TCO/缓冲层对Cu(In,Ga)Se2太阳能电池湿热加速寿命测试的影响","authors":"C. Thompson, S. Hegedus, P. Carcia, R. S. Mclean","doi":"10.1109/pvsc-vol2.2012.6656788","DOIUrl":null,"url":null,"abstract":"In Cu(In,Ga)Se2 solar cells encapsulated with polyethylene terephthalate (PET) or glass top sheets, the effects of damp heat (D-H) accelerated lifetime testing (ALT) depend on water vapor transmission rate (WVTR) of both transparent conducting oxide (TCO) and the intrinsic zinc oxide (i-ZnO) buffer, as well as device geometry. PET top sheets have a WVTR of ∼10 g/m2·day, and glass has a WVTR of 0. Previously, coupons encapsulated with PET degraded to 50% of initial efficiency after 1000 h D-H ALT. We show that PET encapsulated coupons degrade at the same rate as glass encapsulated coupons after 2000 h D-H ALT to 92% of initial efficiency. The only change from previous work is that, here, i-ZnO covers the entire coupon surface, not the just active area. The WVTR of the i-ZnO/TCO stack is 2 × 10−3 g·H2 O/m2·day. A set of unencapsulated devices went through D-H ALT, one where scribing was used to define the active area of the device and another without scribing; both were protected only by 50-nm i-ZnO. The bare-unscribed device performed as well as the previous glass and PET encapsulated coupons after 1500 h D-H ALT; the bare-scribed device degraded to 78% of initial efficiency, indicating that TCO integrity is a critical ALT parameter.","PeriodicalId":6420,"journal":{"name":"2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2013-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"The effects of device geometry and TCO/buffer layers on damp heat accelerated lifetime testing of Cu(In,Ga)Se2 solar cells\",\"authors\":\"C. Thompson, S. Hegedus, P. Carcia, R. S. Mclean\",\"doi\":\"10.1109/pvsc-vol2.2012.6656788\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In Cu(In,Ga)Se2 solar cells encapsulated with polyethylene terephthalate (PET) or glass top sheets, the effects of damp heat (D-H) accelerated lifetime testing (ALT) depend on water vapor transmission rate (WVTR) of both transparent conducting oxide (TCO) and the intrinsic zinc oxide (i-ZnO) buffer, as well as device geometry. PET top sheets have a WVTR of ∼10 g/m2·day, and glass has a WVTR of 0. Previously, coupons encapsulated with PET degraded to 50% of initial efficiency after 1000 h D-H ALT. We show that PET encapsulated coupons degrade at the same rate as glass encapsulated coupons after 2000 h D-H ALT to 92% of initial efficiency. The only change from previous work is that, here, i-ZnO covers the entire coupon surface, not the just active area. The WVTR of the i-ZnO/TCO stack is 2 × 10−3 g·H2 O/m2·day. A set of unencapsulated devices went through D-H ALT, one where scribing was used to define the active area of the device and another without scribing; both were protected only by 50-nm i-ZnO. The bare-unscribed device performed as well as the previous glass and PET encapsulated coupons after 1500 h D-H ALT; the bare-scribed device degraded to 78% of initial efficiency, indicating that TCO integrity is a critical ALT parameter.\",\"PeriodicalId\":6420,\"journal\":{\"name\":\"2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/pvsc-vol2.2012.6656788\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/pvsc-vol2.2012.6656788","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
摘要
在用聚对苯二甲酸乙二醇酯(PET)或玻璃顶片封装的Cu(In,Ga)Se2太阳能电池中,湿热(D-H)加速寿命测试(ALT)的影响取决于透明导电氧化物(TCO)和固有氧化锌(i-ZnO)缓冲液的水蒸气透过率(WVTR),以及器件的几何形状。PET顶板的WVTR为~ 10 g/m2·天,玻璃的WVTR为0。之前,用PET封装的薄片在1000 h D-H ALT后降解到初始效率的50%。我们发现,PET封装的薄片在2000 h D-H ALT后降解率与玻璃封装的薄片相同,达到初始效率的92%。与以前的研究相比,唯一的变化是,在这里,i-ZnO覆盖了整个复合材料表面,而不仅仅是活性区域。i-ZnO/TCO堆的WVTR为2 × 10−3 g·H2 O/m2·day。一组未封装的设备通过D-H ALT,其中一组使用划线来定义设备的活动区域,另一组不使用划线;两者都仅被50 nm的i-ZnO保护。在1500 h D-H ALT后,裸裸装置的性能与先前的玻璃和PET封装的薄片一样好;裸刻器件的效率下降到初始效率的78%,表明TCO完整性是一个关键的ALT参数。
The effects of device geometry and TCO/buffer layers on damp heat accelerated lifetime testing of Cu(In,Ga)Se2 solar cells
In Cu(In,Ga)Se2 solar cells encapsulated with polyethylene terephthalate (PET) or glass top sheets, the effects of damp heat (D-H) accelerated lifetime testing (ALT) depend on water vapor transmission rate (WVTR) of both transparent conducting oxide (TCO) and the intrinsic zinc oxide (i-ZnO) buffer, as well as device geometry. PET top sheets have a WVTR of ∼10 g/m2·day, and glass has a WVTR of 0. Previously, coupons encapsulated with PET degraded to 50% of initial efficiency after 1000 h D-H ALT. We show that PET encapsulated coupons degrade at the same rate as glass encapsulated coupons after 2000 h D-H ALT to 92% of initial efficiency. The only change from previous work is that, here, i-ZnO covers the entire coupon surface, not the just active area. The WVTR of the i-ZnO/TCO stack is 2 × 10−3 g·H2 O/m2·day. A set of unencapsulated devices went through D-H ALT, one where scribing was used to define the active area of the device and another without scribing; both were protected only by 50-nm i-ZnO. The bare-unscribed device performed as well as the previous glass and PET encapsulated coupons after 1500 h D-H ALT; the bare-scribed device degraded to 78% of initial efficiency, indicating that TCO integrity is a critical ALT parameter.